It takes time to repair cases if there is failure in integrated circuits. For cases like this our company has acquired Polar Fault Locater 780 measurement unit. With this unit you can use Analog Signature Analysis to locate faults in integrated circuits.

The goal of this Master’s Thesis is to find out if it’s possible to use this kind of measurement in repairing services. Some of the integrated circuits were damaged on purpose. The results were compared and assumptions were made if you can locate the fault. The Methods used were literature and empirical research.

The results were that this measurement can be used to evaluate integrated circuits. Tough the results were hard to understand and the lack of background material was problematic. The measurement unit is as its best when used in cases with multiple units where the results can be compared. It was found out that there was significant difference in measurements results, when components were damaged.