Scanning electron microscopy and x-ray microanalysis
Finna rating
Scanning electron microscopy and x-ray microanalysis
Saved in:
| Physical Description |
xxiii, 550 sivua : kuvitettu |
|---|---|
| Language |
English |
| Publisher |
New York :
Springer,
©2018
|
| Classification | |
| Subjects | |
| Additional Information | Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy |
| ISBN |
9781493982691 nidottu |