Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A
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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A
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| Physical Description |
604 sivua : kuvitettu |
|---|---|
| Language |
English |
| Language of Original Work |
English |
| Language of Abstract |
English |
| Publisher |
Pittsburgh, PA :
Materials Research Society,
cop. 1985.
|
| Series | Materials Research Society symposia proceedings, vol. 46. |
| Classification | |
| Additional Information | eds.: Noble M. Johnson, Stephen G. Bishop, George D. Watkins |
| ISBN |
0-931837-11-1 |