Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
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Technological change and regulatory heterogeneity : a comparative study on patent infringement analysis in the US, Japan and Korea
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Physical Description |
235, [1] sivua : kuvitettu ; 25 cm |
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Language |
English |
Language of Original Work |
English |
Language of Abstract |
English |
Publisher |
Vaasa :
University of Vaasa,
2000.
|
Series | Vaasan yliopiston julkaisuja, Tutkimuksia, ISSN 0788-6667; 233. Vaasan yliopiston julkaisuja, ISSN 0788-673X; 8. |
Classification | |
Subjects | |
Additional Information | Na Ri Lee |
ISBN |
951-683-859-6 nidottu |